Scanning Probe Microscope ( AFM/STM modes in one system)

Scanning Probe Microscope

AFM/STM modes in one system

Featuring an innovative ergonomic design and advanced electronics, our Scientific Microscope delivers atomic-scale resolution for the cost, the price is perhaps the most surprising feature and make this microscope even more attractive.
Our Educational model makes it an ideal choice for education as well as research, The NAMA-SPM offers educators an exceptional microscope for their students with this powerful SPM/AFM-STM techniques.

Atomic Force Microscope Features

Modes
  • Constant Force: constant Height option: Zero contact: Semi Contact:
Force Spectroscopy
Microscopy
  • LFM: Lateral Force: MFM: Magnetic Force: MFM: Magnetic Force: PDM: Phase Detection: FMM: Force Modulation

STM mode

Constant Height: Constant Current
Lithography
Spectroscopy

Educational model

Scanning tunneling Microscope

Especially designed and manuctured for the Educationa areas of research, Robust, flexible and easy to understand. A great aid for the lecturer and learning facilitator to aid the exporation of the atomic world, with image of atoms, nanosctructures, Nano-morphology fo conductiong surfaces.

Applications

  • Biological
  • Non Biological
  • Atomic: Scale imaging solid surface
  • Atom and Nano Structure manipulation
  • Spectroscopy of sample at desired area
  • Opto-electronics
  • Surface materials
  • semiconductor
  • Chemistry
  • Solid-state physics
  • Medicine
  • plus many more to mention

Atomic Force Technical Specifications

  • X,Y Scanning 30 micrometre
  • Z scanning 5 micrometre
  • lateral resolution 0.13nanometre
  • Vertical Resolution 0.05 nanometre
  • Scanning method: Movable sample under stationary probe
  • Piezo Ceramic type scanner
  • Maximum sample size: 20 mm
  • XY Micro positioning stage step: 2.5 micrometres
  • Embedded video system: visualization on PD via USB port
  • DAC/ADC resolution 16 bit
  • CE conformity

Scanning probe Technical Specifications

  • X,Y Scanning 30 micrometre
  • Z scanning 5 micrometre
  • lateral resolution 0.13nanometre
  • Vertical Resolution 0.05 nanometre
  • Scanning method: Movable sample under stationary probe
  • Piezo Ceramic type scanner
  • Maximum sample size: 20 mm
  • XY Micro positioning stage step: 2.5 micrometres
  • Embedded video system: visualization on PD via USB port
  • DAC/ADC resolution 16 bit
  • CE conformity